Nanotechnology is having a profound impact on new instrumentation for microscopy and imaging, driving next-generation technologies toward smaller footprints, sleeker profiles, more economical systems, and invigorating microscopy/ spectroscopy hybrids. Three new trends: Desktop SEMs, the collision between microscopy & spectroscopy, and the rise of high resolution nanoscale imaging in light microscopy.

(McKinney, TX. Aug 1, 2008). MIP President and Senior Strategic Consultant, Barbara Foster, will discuss the impact of Nanotechnology on new instrumentation at the upcoming Microscopy & Microanalysis meeting (Aug, 2008). Her invited paper focuses on three key trends:  the recent proliferation of desktop scanning electron microscopes (SEMs), the long-awaited convergence of microscopy and spectroscopy, and new developments in nano-scale, high resolution light microscopy.

In the first section of her presentation, she will review recent entrants in the new family of SEMs designed to fill the gap between magnification of conventional light microscopy (1000x magnification) and the more powerful, research level SEMs and Transmission Electron microscopes (TEMs) (20,000x magnification or greater).    Next, she will move to the exciting convergence of various spectroscopies with microscopy to form hyperspectral imaging systems, including systems which either interface or integrate Fourier Transform Infrared spectroscopy (FT-IR) to light microscopy or Raman spectroscopy to light, SEM, and atomic force microscopy (AFM). This section will feature the instrumentation from industry-leading Raman/imaging companies such as Horiba-JY, Renishaw, and Witec and the long standing FT-IR leader, Smiths Detection.  "As a strategic consultant,  I've been waiting for this convergence for nearly a decade," cited Ms. Foster. "This Spring, it happened with a vengeance, resulting in a panoply of exciting, valuable hybrid tools that will address the new challenges in everything from where a drug goes in a cell to what is happening as carbon nanotubes or graphene sheets form."

Ms. Foster will close her  presentation with an overview of intriguing accessories such as novel condenser/illumination systems and Sarfus' unique substrates which extend light microscopy from the micro realm into true "nanoscopy."

The paper will be given in the Special Topic session: "EM Preparation Revisited and Dealing with the Nanoworld".  It is Session X32B:  "Nanotech drives imaging toward faster, sleeker, more economical," Wednesday, August 6, 2008 from 1:30PM to 2:00PM in the Mesilla Room.  In addition to Ms. Foster, several of The MIP consulting staff will also be available for on-site meetings

M&M is the premier microscopy and imaging meeting here in the US and is highly regarded world-wide.  This year, the meeting will be co-sponsored by the Microscopy Society of America (MSA), the Microbeam Analysis Society (MAS), the International Metallographic Society (IMS) and the International Society of Analytical Cytology (ISAC).  In addition an excellent and far-reaching technical program, the meeting also hosts an extensive exhibit and offers a broad array of tutorials.

Further details about The MIP are available at http://www.microscopymarket.com/.  For details about  M&M, visit http://www.microscopy.org/.